Search Results - Guibaud, Gerald

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Localization and Physical Analysis of Defects in Degraded Power HEMT p-GaN Transistors Stressed with DC Voltage Surge and Voltage with Switching Stress

    Localization and Physical Analysis of Defects in Degraded Power HEMT p-GaN Transistors Stressed with DC Voltage Surge and Voltage with Switching Stress by Ghizzo, Lucien, Guibaud, Gérald, De Nardi, Christophe, Jamin, François, Chazal, Vanessa, Trémouilles, David, Monflier, Richard, Richardeau, Frédéric, Bascoul, Guillaume, González Sentís, Manuel

    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  2. 2
    Analysis of Failure Mechanisms Occuring at Breakdown Voltage in power p-GaN HEMT

    Analysis of Failure Mechanisms Occuring at Breakdown Voltage in power p-GaN HEMT by Ghizzo, Lucien, Tremouilles, David, Guibaud, Gerald, de Nardi, Christophe, Chazal, Vanessa, Chauvin, Helene, Jamin, Francois, Richardeau, Frederic

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  3. 3
    Reactivity to Visual Signals and the Cerebellar Vermis: Evidence From a Rare Case With Rhombencephalosynapsis

    Reactivity to Visual Signals and the Cerebellar Vermis: Evidence From a Rare Case With Rhombencephalosynapsis by Michael, George A, Garcia, Sophie, Bussy, Gérald, Lion-François, Laurence, Guibaud, Laurent

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: