3D-air quality model evaluation using the Lidar technique by Duclaux, O, Frejafon, E, Schmidt, H, Thomasson, A, Mondelain, D, Yu, J, Guillaumond, C, Puel, C, Savoie, F, Ritter, P, Boch, J.P, Wolf, J.P

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TAp73 loss favors Smad-independent TGF-β signaling that drives EMT in pancreatic ductal adenocarcinoma by Thakur, A K, Nigri, J, Lac, S, Leca, J, Bressy, C, Berthezene, P, Bartholin, L, Chan, P, Calvo, E, Iovanna, J L, Vasseur, S, Guillaumond, F, Tomasini, R

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Stromal SLIT2 impacts on pancreatic cancer-associated neural remodeling by Secq, V, Leca, J, Bressy, C, Guillaumond, F, Skrobuk, P, Nigri, J, Lac, S, Lavaut, M-N, Bui, T-t, Thakur, A K, Callizot, N, Steinschneider, R, Berthezene, P, Dusetti, N, Ouaissi, M, Moutardier, V, Calvo, E, Bousquet, C, Garcia, S, Bidaut, G, Vasseur, S, Iovanna, J L, Tomasini, R

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Ketogenic HMG‐CoA lyase and its product β‐hydroxybutyrate promote pancreatic cancer progression by Gouirand, Victoire, Gicquel, Tristan, Lien, Evan C, Jaune‐Pons, Emilie, Da Costa, Quentin, Finetti, Pascal, Metay, Elodie, Duluc, Camille, Mayers, Jared R, Audebert, Stephane, Camoin, Luc, Borge, Laurence, Rubis, Marion, Leca, Julie, Nigri, Jeremy, Bertucci, François, Dusetti, Nelson, Iovanna, Juan Lucio, Tomasini, Richard, Bidaut, Ghislain, Guillaumond, Fabienne, Vander Heiden, Matthew G, Vasseur, Sophie

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Targeted imaging of pancreatic adenocarcinoma with a LDLR vector-cargo conjugate by Acier, A., Lecorche, P., Godard, M., Gassiot, F., Mercadal, N., Finetti, P., Barea, D., Rubis, M., Nowak, J., Bertucci, F., Birnbaum, D., Iovanna, J., Jacquot, G., Khrestchatisky, M., Temsamani, J., Malicet, C., Vasseur, S., Guillaumond, F.

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Krüppel-Like Factor KLF10 Is a Link between the Circadian Clock and Metabolism in Liver by Guillaumond, Fabienne, Gréchez-Cassiau, Aline, Subramaniam, Malayannan, Brangolo, Sophie, Peteri-Brünback, Brigitta, Staels, Bart, Fiévet, Catherine, Spelsberg, Thomas C, Delaunay, Franck, Teboul, Michèle

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TAp73 loss favors Smad-independent TGF-[beta] signaling that drives EMT in pancreatic ductal adenocarcinoma by Thakur, A K, Nigri, J, Lac, S, Leca, J, Bressy, C, Berthezene, P, Bartholin, L, Chan, P, Calvo, E, Iovanna, J L, Vasseur, S, Guillaumond, F, Tomasini, R

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Bias-stress-induced evolution of the dielectric properties of porous-ULK/ copper advanced interconnects by Guedj, C., Portier, X., Mondon, F., Arnal, V., Guillaumond, J.F., Arnaud, L., Barnes, J.P., Jousseaume, V., Roule, A., Maitrejean, S., Chapelon, L.L., Reimbold, G., Torres, J., Passemard, G.

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Influence of the sidewall diffusion barrier on the transport properties of advanced Cu/low- k interconnects by Guedj, Cyril, Guillaumond, Jean-Frédéric, Arnaud, Lucile, Arnal, Vincent, Aimadeddine, Mohamed, Reimbold, Gilles, Torres, Joaquin

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Analysis of Electromigration Voiding Phenomena in Cu Interconnects by Arnaud, L., Guillaumond, J.F., Claret, N., Cayron, C., Guedj, C., Dupeux, M., Arnal, V., Reimbold, G., Passemard, G., Torres, J.

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Electro-optical reliability characterization of advanced Cu/low-k interconnects by Guedj, C., Guillaumond, J.F., Mondon, F., Arnaud, L., Arnal, V., Reimbold, G., Torres, J.

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Influence of diffusion barrier on reliability. Identification of diffusion paths in Cu/porous low k interconnect by Guillaumond, J.F., Arnaud, L., Guedj, C., Arnal, V., Besling, W.F.A., Reimbold, G., Dupeux, M., Torres J

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Krüppel-Like Factor KLF10 Is a Link between the Circadian Clock and Metabolism in Liver by Guillaumond, Fabienne, Gréchez-Cassiau, Aline, Subramaniam, Malayannan, Brangolo, Sophie, Peteri-Brünback, Brigitta, Staels, Bart, Fiévet, Catherine, Spelsberg, Thomas C., Delaunay, Franck, Teboul, Michèle

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De l'Ostéotomie sous-trochantérienne linéaire et sous-cutanée dans le redressement des attitudes vicieuses post-coxalgiques chez l'enfant by Guillaumond, Léon. Auteur du texte

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Tonsillar diffusion kinetics of amoxycillin after oral administration of 1 g to adults by CHOMARAT, M, PANTEIX, G, GUILLAUMOND, B, DUBREUIL, C

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Effect of pore sealing on the reliability of ULK/Cu interconnects by Guedj, C., Arnaud, L., Fayolle, M., Jousseaume, V., Guillaumond, J.F., Cluzel, J., Toffoli, A., Reimbold, G., Bouchu, D.

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Influence of the diffusion barriers on the dielectric reliability of ULK/Cu advanced interconnects by Guedj, C., Arnal, V., Guillaumond, J.F., Arnaud, L., Barnes, J.P., Toffoli, A., Jousseaume, V., Roule, A., Maitrejean, S., Chapelon, L.L., Reimbold, G., Torres, J., Passemard, G.

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Reliability challenges accompanied with interconnect downscaling and ultra low-k dielectrics by Hoofman, R.J.O.M., Michelon, J., Bancken, P.H.L., Daamen, R., Verheijden, G.J.A.M., Arnal, V., Hinsinger, O., Gosset, L.G., Humbert, A., Besling, W.F.A., Goldberg, C., Fox, R., Michaelson, L., Guedj, C., Guillaumond, J.F., Jousseaume, V., Arnaud, L., Gravesteijn, D.J., Torres, J., Passemard, G.

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Integration of ALD TaN barriers in porous low-k interconnect for the 45 nm node and beyond; solution to relax electron scattering effect by Besling, W.F.A., Arnal, V., Guillaumond, J.R., Guedj, C., Broekaart, M., Chapelon, L.L., Farcy, A., Arnaud, L., Torres, J.

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Integration of ALD TaN barriers in porous low-k interconnect for the 45 nm node and beyond; solution to relax electron cattering effect by BESLING, W. F. A, ARNAL, V, GUILLAUMOND, J. F, GUEDJ, C, BROEKAART, M, CHAPELON, L. L, FARCY, A, ARNAUD, L, TORRES, J

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