Search Results - Gwangpyuk Suh

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    New insight into stress induced voiding mechanism in Cu interconnects

    New insight into stress induced voiding mechanism in Cu interconnects by Sun-Jung Lee, Soo-Geun Lee, Bong-Suk Suh, Hongjae Shin, Nae-In Lee, Ho-Kyu Kang, Gwangpyuk Suh

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