Search Results - Gwilliam, Russel

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  1. 1
    X-ray induced Sm-ion valence conversion in Sm-ion implanted fluoroaluminate glasses towards high-dose radiation measurement

    X-ray induced Sm-ion valence conversion in Sm-ion implanted fluoroaluminate glasses towards high-dose radiation measurement by Chicilo, Farley, Koughia, Cyril, Curry, Richard, Gwilliam, Russel, Ahumada-Lazo, Ruben, Edgar, Andy, Binks, David J., Chapman, Dean, Kasap, Safa

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  2. 2
    (Invited) Novel Processing for Si-Nanocrystal Based Photonic Materials

    (Invited) Novel Processing for Si-Nanocrystal Based Photonic Materials by Halsall, Matthew P., Crowe, Iain Forbes, Hylton, Nicholas, Hulko, Oksana, Knights, Andrew, Ruffell, Simon, Gwilliam, Russel, Wojdak, Maciej, Kenyon, Anthony

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    Very low energy implanted Bragg gratings in SOI for wafer scale testing applications

    Very low energy implanted Bragg gratings in SOI for wafer scale testing applications by Loiacono, R., Topley, R., Nakyobe, A., Mashanovich, G., Gwilliam, R., Lulli, G., Feldesh, R., Jones, R., Reed, G.

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    SIMS characterization of thin layers of IR and its silicides

    SIMS characterization of thin layers of IR and its silicides by Blanco, JoséM., Serrano, JoséJ., Jiménez-Leube, Javier, Rodríguez, Tomás, Aguilar, Miguel, Gwilliam, Russel

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