Search Results - HAFER, Craig C

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  1. 1
    Analysis of Single-Event Transients in Integer- N Frequency Dividers and Hardness Assurance Implications for Phase-Locked Loops

    Analysis of Single-Event Transients in Integer- N Frequency Dividers and Hardness Assurance Implications for Phase-Locked Loops by Loveless, T.D., Olson, B.D., Bhuva, B.L., Holman, W.T., Hafer, C.C., Massengill, L.W.

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  2. 2
    Single-event effect radiation test results of radiation-hardened IEEE 1394 firewire ASICs

    Single-event effect radiation test results of radiation-hardened IEEE 1394 firewire ASICs by PRITCHARD, Bruce E, UNDERWOOD, Joe B, MURLIN, W. Doug, COLEMAN, Andrea M, WOLFRAM, Kenneth D, WARNER, Jeff B, HAFER, Craig C

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  3. 3
    Investigation and Mitigation of Analog SET on a Bandgap Reference in Triple-Well CMOS Using Pulsed Laser Techniques

    Investigation and Mitigation of Analog SET on a Bandgap Reference in Triple-Well CMOS Using Pulsed Laser Techniques by Zanchi, A., Buchner, S., Hafer, C., Hisano, S., Kerwin, D. B.

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  4. 4
    A Comprehensive Methodology to Rate SETs of Complex Analog and Mixed-Signal Circuits Demonstrated on 16-bit A-to-D Converters

    A Comprehensive Methodology to Rate SETs of Complex Analog and Mixed-Signal Circuits Demonstrated on 16-bit A-to-D Converters by Zanchi, A., Buchner, S., Hisano, S., Wilson, A., Hafer, C., Kerwin, D. B.

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  5. 5
    Investigation of Low Cross Section Events in the RHBD/FT UT699 Leon 3FT

    Investigation of Low Cross Section Events in the RHBD/FT UT699 Leon 3FT by Guertin, S. M., Hafer, C., Griffith, S.

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  6. 6
    SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device

    SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device by Hafer, C., Von Thun, M., Mundie, M., Bass, D., Sievert, F.

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  7. 7
    130nm Single Event Upset Performance Evaluation: Commercial vs. Hardened by Design Architectures

    130nm Single Event Upset Performance Evaluation: Commercial vs. Hardened by Design Architectures by Dumitru, R., Hafer, C., Tzu-Wen Wu, Rominger, R., Milliken, P., Bruno, K., Farris, T.

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  8. 8
    Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

    Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab by Hafer, C., Lahey, M., Harris, D., Larsen, J., Sievert, F., Sims, T., Meyer, S., Dumitru, R., Jordan, A., Milliken, P.

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  9. 9
    Next generation radiation-hardened SRAM for space applications

    Next generation radiation-hardened SRAM for space applications by Hafer, C., Mabra, J., Slocum, D., Kalkur, T.S.

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  10. 10
    The effects of device metal interconnect overlayers on SEE testing

    The effects of device metal interconnect overlayers on SEE testing by Wert, J., Normand, E., Hafer, C.

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  11. 11
    Single event effects testing of a PLL and LVDS in a RadHard-by-design 0.25-micron ASIC

    Single event effects testing of a PLL and LVDS in a RadHard-by-design 0.25-micron ASIC by Hartwell, M., Hafer, C., Milliken, P., Farris, T.

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  12. 12
    RadHard 16Mbit SRAM Packaged in a Cantilever Die Multi-Chip Module

    RadHard 16Mbit SRAM Packaged in a Cantilever Die Multi-Chip Module by Hafer, C., Mabra, J., Slocum, D., Thorne, S.

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  13. 13
    RadHard 16Mbit Monolithic SRAM for Space Applications

    RadHard 16Mbit Monolithic SRAM for Space Applications by Hafer, C., Mabra, J., Slocum, D.

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  14. 14
    Commercially fabricated radiation hardened 4Mbit SRAM

    Commercially fabricated radiation hardened 4Mbit SRAM by Hafer, C., Slocum, D., Mabra, J., Tyson, S.

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  15. 15
    A RadHard-by-Design Clock Generator

    A RadHard-by-Design Clock Generator by Hafer, C., Schnathorst, V., Pfeil, J., Meade, T.

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  16. 16
    Single Event Effects of commercial and Hardened by design SRAM

    Single Event Effects of commercial and Hardened by design SRAM by Milliken, P., Dumitru, R., Hafer, C., Tzu-Wen Wu, Rominger, R., Bruno, K., Farris, T.

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  17. 17
    Megarad total ionizing dose and single event effects test results of a radhard-by-design 0.25 micron ASIC [space applications]

    Megarad total ionizing dose and single event effects test results of a radhard-by-design 0.25 micron ASIC [space applications] by Hartwell, M., Hafer, C., Milliken, P., Farris, T.

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  18. 18
    Radiation Hardness Testing Results for a Commercially Fabricated RadHard-by-Design Clock Generator

    Radiation Hardness Testing Results for a Commercially Fabricated RadHard-by-Design Clock Generator by Jordan, A., Farris, T., Hafer, C., Schnathorst, V., Pfeil, J., Meade, T.

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