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TDDB and Pulse-Breakdown Studies of Si-Rich hbox SiN x Antifuses and Antifuse-Based ROMs
by
Kaplar, Robert J
,
Habermehl, Scott D
,
Apodaca, Roger T
,
Havener, Brad
,
Roherty-Osmun, Elizabeth
Published in
IEEE transactions on electron devices
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TDDB and Pulse-Breakdown Studies of Si-Rich \hbox Antifuses and Antifuse-Based ROMs
by
Kaplar, R J
,
Habermehl, S D
,
Apodaca, R T
,
Havener, B
,
Roherty-Osmun, E
Published in
IEEE transactions on electron devices
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TDDB and Pulse-Breakdown Studies of Si-Rich [Formula Omitted] Antifuses and Antifuse-Based ROMs
by
Kaplar, Robert J
,
Habermehl, Scott D
,
Apodaca, Roger T
,
Havener, Brad
,
Roherty-Osmun, Elizabeth
Published in
IEEE transactions on electron devices
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TDDB and Pulse-Breakdown Studies of Si-Rich SiNx Antifuses and Antifuse-Based ROMs
by
KAPLAR, Robert J
,
HABERMEHL, Scott D
,
APODACA, Roger T
,
HAVENER, Brad
,
ROHERTY-OSMUN, Elizabeth
Published in
IEEE transactions on electron devices
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Ieee Transactions On Electron Devices
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Subjects
Dielectric Breakdown
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3
Antifuse
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2
Pulse Testing
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2
Reliability
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2
Silicon Nitride
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2
Antifuses
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Applied Sciences
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Barriers
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Breakdown
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Design. Technologies. Operation Analysis. Testing
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Devices
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Electronic Devices
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Electronics
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Engineering
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Engineering, Electrical & Electronic
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Exact Sciences And Technology
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Integrated Circuits
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Integrated Circuits By Function
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Laboratories
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Physical Sciences
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Ieee Xplore (Online Service)
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Ieee Xplore All Journals
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