Search Results - Habersat, Dan

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  1. 1
    Reliability of Commercially Available SiC Power MOSFETs

    Reliability of Commercially Available SiC Power MOSFETs by Lelis, Aivars, Green, Ron, El, Mooro, Habersat, Dan

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  2. 2
    AlN thin films deposited by pulsed laser ablation, sputtering and filtered arc techniques

    AlN thin films deposited by pulsed laser ablation, sputtering and filtered arc techniques by Bathe, Ravi, Vispute, R.D, Habersat, Dan, Sharma, R.P, Venkatesan, T, Scozzie, C.J, Ervin, Matt, Geil, B.R, Lelis, A.J, Dikshit, S.J, Bhattacharya, R

    Published in Thin solid films
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  3. 3
    SiC MOSFET oxide-trap two-way tunneling model

    SiC MOSFET oxide-trap two-way tunneling model by Lelis, A., Habersat, D., Green, R., Goldsman, N.

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  4. 4
    On-state current stress-induced subthreshold I-V instability in SiC DMOSFETs

    On-state current stress-induced subthreshold I-V instability in SiC DMOSFETs by Lelis, A., Green, R., Habersat, D., Goldsman, N.

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    AlN thin films deposited by pulsed laser ablation, sputtering and filtered arc techniques

    AlN thin films deposited by pulsed laser ablation, sputtering and filtered arc techniques by BATHE, Ravi, VISPUTE, R. D, BHATTACHARYA, R, HABERSAT, Dan, SHARMA, R. P, VENKATESAN, T, SCOZZIE, C. J, ERVIN, Matt, GEIL, B. R, LELIS, A. J, DIKSHIT, S. J

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