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    Ultrathin SiONC passivation of c-Si by UHV thermal annealing in O₂/N₂: Chemical composition, morphology, and photoluminescence insights

    Ultrathin SiONC passivation of c-Si by UHV thermal annealing in O₂/N₂: Chemical composition, morphology, and photoluminescence insights by Halitim, Brahim, Guezzoul, M'hamed, Nouri, Abdelkader, Zegadi, Chewki, Bouslama, M'hammed

    Published in Optical materials
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