Search Results - Han, Gus Chang-Hung

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  1. 1
    Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement

    Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement by Li, Katherine Shu-Min, Liao, Peter Yi-Yu, Cheng, Ken Chau-Cheung, Chen, Leon Li-Yang, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Han, Gus Chang-Hung, Chen, Jwu E., Liang, Hsin-Chung, Hsu, Chung-Lung

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    Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization

    Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization by Li, Katherine Shu-Min, Chen, Leon Li-Yang, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yeh, Cheng, Ken Chau-Cheung, Han, Gus Chang-Hung, Lee, Chen-Shiun, Chen, Jwu E., Liang, Hsing-Chung, Hsu, Chung-Lung

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  3. 3
    PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques

    PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques by Li, Katherine Shu-Min, Liao, Peter Yi-Yu, Chou, Leon, Chen, Ken Chau-Cheung, Huang, Andrew Yi-Ann, Wang, Sying-Jyan, Han, Gus Chang-Hung

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    Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering

    Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering by Li, Katherine Shu-Min, Li-Yang Chen, Leon, Cheng, Ken Chau-Cheung, Yi-Yu Liao, Peter, Wang, Sying-Jyan, Huang, Andrew Yi-An, Tsai, Nova, Chou, Leon, Han, Gus Chang-Hung, Chen, Jwu E, Liang, Hsing-Chung, Hsu, Chun-Lung

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