Search Results - Hantos, Gusztav

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  1. 1
    Parameter Extraction for a SPICE-like Delphi4LED Multi-Domain Chip-Level LED Model with an Improved Nelder–Mead Method

    Parameter Extraction for a SPICE-like Delphi4LED Multi-Domain Chip-Level LED Model with an Improved Nelder–Mead Method by Németh, Márton, Hegedüs, János, Hantos, Gusztáv, Abdulrazzaq, Ali Kareem, Poppe, András

    Published in Applied sciences
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  2. 2
    Mixed Detailed and Compact Multi-Domain Modeling to Describe CoB LEDs

    Mixed Detailed and Compact Multi-Domain Modeling to Describe CoB LEDs by Pohl, László, Hantos, Gusztáv, Hegedüs, János, Németh, Márton, Kohári, Zsolt, Poppe, András

    Published in Energies (Basel)
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  3. 3
    Different questions of today's LED thermal testing procedures

    Different questions of today's LED thermal testing procedures by Hantos, Gusztav, Hegedus, Janos, Poppe, Andras

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  4. 4
    Lifetime Modelling Issues of Power Light Emitting Diodes

    Lifetime Modelling Issues of Power Light Emitting Diodes by Hegedüs, János, Hantos, Gusztáv, Poppe, András

    Published in Energies (Basel)
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  5. 5
    Multi-Domain Modelling of LEDs for Supporting Virtual Prototyping of Luminaires

    Multi-Domain Modelling of LEDs for Supporting Virtual Prototyping of Luminaires by Poppe, András, Farkas, Gábor, Gaál, Lajos, Hantos, Gusztáv, Hegedüs, János, Rencz, Márta

    Published in Energies (Basel)
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  6. 6
    Lifetime Test of Pulsewidth Modulated LEDs Supplemented With Thermal Investigations

    Lifetime Test of Pulsewidth Modulated LEDs Supplemented With Thermal Investigations by Hegedüs, János, Hantos, Gusztáv, Lukács, Máté, Bodnár, Bence, Lipák, Gyula, Poppe, András

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  7. 7
    Climatically Accelerated Material Processes Determining the Long-Term Reliability of Light-Emitting Diodes

    Climatically Accelerated Material Processes Determining the Long-Term Reliability of Light-Emitting Diodes by Harsanyi, Gabor, Poppe, Andras, Hegedüs, Janos, Hantos, Gusztav, Bojta, Peter, Kovacs, Robert

    Published in Materials
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  8. 8
    Lifetime test of pulse width modulated LEDs supplemented with thermal investigations

    Lifetime test of pulse width modulated LEDs supplemented with thermal investigations by Hegedus, Janos, Hantos, Gusztav, Lukacs, Mate, Bodnar, Bence, Lipak, Gyula, Poppe, Andras

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  9. 9
    K-factor calibration issues of high power LEDs

    K-factor calibration issues of high power LEDs by Hantos, Gusztav, Hegedus, Janos

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  10. 10
    Implementation of a Multi-domain LED Model and its Application for Optimized LED Luminaire Design

    Implementation of a Multi-domain LED Model and its Application for Optimized LED Luminaire Design by Hegedus, Janos, Hantos, Gusztav, Bornoff, Robin, Rencz, Marta, Poppe, Andras

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  11. 11
    Thermally enhanced FOWLP-development of a Power-eWLB demonstrator

    Thermally enhanced FOWLP-development of a Power-eWLB demonstrator by Cardoso, Andre, Pires, Mariana, Pinto, Raquel, Hantos, Gusztav

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  12. 12
    Application of the transient dual interface method in test based modeling of heat-sinks aimed at socketable LED modules

    Application of the transient dual interface method in test based modeling of heat-sinks aimed at socketable LED modules by Poppe, Andras, Hantos, Gusztav, Hegedus, Janos

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  13. 13
    Thermal transient characterization of semiconductor devices with multiple heat sources—Fundamentals for a new thermal standard

    Thermal transient characterization of semiconductor devices with multiple heat sources—Fundamentals for a new thermal standard by Schweitzer, Dirk, Ender, Ferenc, Hantos, Gusztáv, Szabó, Péter G.

    Published in Microelectronics
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  14. 14
    The minimal set of IVL measurements to characterize power LED chips

    The minimal set of IVL measurements to characterize power LED chips by Nemeth, Marton, Hantos, Gusztav, Hegedus, Janos

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  15. 15
    Reliability testing of mid-power LEDs for the extension of multi-domain LED models with elapsed lifetime as parameter

    Reliability testing of mid-power LEDs for the extension of multi-domain LED models with elapsed lifetime as parameter by Hantos, Gusztav, Hegedus, Janos, Lipak, Gyula, Nemeth, Marton, Poppe, Andras

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  16. 16
    Thermal investigations as part of a remote phosphor aging test

    Thermal investigations as part of a remote phosphor aging test by Hegedus, Janos, Takacs, Dalma, Hantos, Gusztav, Nemeth, Marton, Poppe, Andras

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  17. 17
    An automated method for creating compact dynamic thermal models for in-situ prognostics of power electronics and power LED packages

    An automated method for creating compact dynamic thermal models for in-situ prognostics of power electronics and power LED packages by Poppe, Andras, Hantos, Gusztav, Hegedus, Janos, Ender, Ferenc

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  18. 18
    The effect of dimming frequency on the aging of power LEDs

    The effect of dimming frequency on the aging of power LEDs by Hegedus, Janos, Hantos, Gusztav, Lukacs, Mate, Bodnar, Bence, Poppe, Andras

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  19. 19
    Concepts for high throughput LED testing using high-speed optical transients of LEDs

    Concepts for high throughput LED testing using high-speed optical transients of LEDs by Poppe, Andras, Hantos, Gusztav, Hegedus, Janos, Csuti, Peter, Rencz, Marta

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  20. 20
    Reliability Issues of Mid-Power LEDs

    Reliability Issues of Mid-Power LEDs by Hegedus, Janos, Hantos, Gusztav, Poppe, Andras

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