From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II by Harboe-Sorensen, R., Poivey, C., Guerre, F.-X., Roseng, A., Lochon, F., Berger, G., Hajdas, W., Virtanen, A., Kettunen, H., Duzellier, S.

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Key Contributions to the Cross Section of NAND Flash Memories Irradiated With Heavy Ions by Bagatin, M., Gerardin, S., Cellere, G., Paccagnella, A., Visconti, A., Beltrami, S., Harboe-Sorensen, R., Virtanen, A.

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PROBA-II Technology Demonstration Module In-Flight Data Analysis by Harboe-Sorensen, R., Poivey, C., Zadeh, A., Keating, A., Fleurinck, N., Puimege, K., Guerre, F.-X., Lochon, F., Kaddour, M., Li, L., Walter, D.

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The Technology Demonstration Module On-Board PROBA-II by Harboe-Sorensen, R, Poivey, C, Fleurinck, N, Puimege, K, Zadeh, A, Guerre, F-X, Lochon, F, Kaddour, M, Li, L, Walter, D, Keating, A, Jaksic, A, Poizat, M

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TID Test of an 8-Gbit NAND Flash Memory by Schmidt, H., Grurmann, K., Nickson, B., Gliem, F., Harboe-Sorensen, R.

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Angular Dependence of Heavy Ion Effects in Floating Gate Memory Arrays by Cellere, G., Paccagnella, A., Visconti, A., Bonanomi, M., Harboe-Sorensen, R., Virtanen, A.

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Charge Collection in Power MOSFETs for SEB Characterisation-Evidence of Energy Effects by Ferlet-Cavrois, V, Sturesson, F, Zadeh, A, Santin, G, Truscott, P, Poivey, C, Schwank, J R, Peyre, D, Binois, C, Beutier, T, Luu, A, Poizat, M, Chaumont, G, Harboe-Sørensen, R, Bezerra, F, Ecoffet, R

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Heavy-Ion Induced Charge Yield in MOSFETs by Javanainen, A., Schwank, J.R., Shaneyfelt, M.R., Harboe-Sorensen, R., Virtanen, A., Kettunen, H., Dalton, S.M., Dodd, P.E., Jaksic, A.B.

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Linear Energy Transfer of Heavy Ions in Silicon by Javanainen, A., Malkiewicz, T., Perkowski, J., Trzaska, W.H., Virtanen, A., Berger, G., Hajdas, W., Harboe-Sorensen, R., Kettunen, H., Lyapin, V., Mutterer, M., Pirojenko, A., Riihimaki, I., Sajavaara, T., Tyurin, G., Whitlow, H.J.

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SEL and SEU In-Flight Data From Memories on-board PROBA-II Spacecraft by Poivey, C., Harboe-Sorensen, R., Pinto, M., Poizat, M., Fleurinck, N., Grurmann, K., Schmidt, H.

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Laser SEE Sensitivity Mapping of SRAM Cells by Chugg, A.M., Burnell, A.J., Moutrie, M.J., Jones, R., Harboe-Sorensen, R.

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Experimental Linear Energy Transfer of Heavy Ions in Silicon for RADEF Cocktail Species by Javanainen, A., Sillanpaa, M., Trzaska, W.H., Virtanen, A., Berger, G., Hajdas, W., Harboe-Sorensen, R., Kettunen, H., Malkiewicz, T., Mutterer, M., Perkowski, J., Pirojenko, A., Riihimaki, I., Sajavaara, T., Tyurin, G., Whitlow, H.J.

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Heavy Ion Testing and 3-D Simulations of Multiple Cell Upset in 65 nm Standard SRAMs by Giot, D., Roche, P., Gasiot, G., Autran, J.-L., Harboe-Sorensen, R.

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Multiple-Bit Upset Analysis in 90 nm SRAMs: Heavy Ions Testing and 3D Simulations by Giot, D., Roche, P., Gasiot, G., Harboe-Sorensen, R.

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Observation and analysis of single event effects on-board the SOHO satellite by Harboe-Sorensen, R., Daly, E., Teston, F., Schweitzer, H., Nartallo, R., Perol, P., Vandenbussche, F., Dzitko, H., Cretolle, J.

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40 Years of Radiation Single Event Effects at the European Space Agency, ESTEC by Harboe-Sorensen, R.

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Heavy-Ion SEE Test Concept and Results for DDR-II Memories by Harboe-Sorensen, R., Guerre, F.-X., Lewis, G.

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TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory by Schmidt, H., Walter, D., Gliem, F., Nickson, B., Harboe-Sorensen, R., Virtanen, A.

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Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories by Harboe-Sorensen, R., Guerre, F.-X., Loquet, J.-G., Tizon, C.

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Effect of Ion Energy on Charge Loss From Floating Gate Memories by Cellere, G., Paccagnella, A., Visconti, A., Bonanomi, M., Beltrami, S., Harboe-Sorensen, R., Virtanen, A.

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