Simultaneous Electromagnetic Measurement Using a Parallel Modulated Probe Array by Qiang Chen, Sawaya, K., Habu, T., Hasumi, R.

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High-Resolution Laser-Induced Fluorescence Spectra of 7-Azaindole−Water Complexes and 7-Azaindole Dimer by Nakajima, A, Hirano, M, Hasumi, R, Kaya, K, Watanabe, H, Carter, C. C, Williamson, J. M, Miller, Terry A

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Photoelectron spectroscopy of 7-azaindole–water cluster anions by Nakajima, A., Negishi, Y., Hasumi, R., Kaya, K.

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Scalability of Direct Silicon Bonded (DSB) Technology for 32nm Node and Beyond by Yin, Haizhou, Wallner, T.A., Li, J., Ott, J.A., Chen, X., Luo, Z.J., Rovedo, N., Fogel, K., Pfeiffer, G., Kleinhenz, R., Bendernagel, R., Sung, C.Y., Sadana, D.K., Takayanagi, M., Ishimaru, K., Crowder, S.W., Park, D., Khare, M., Shahidi, G., Saenger, K.L., Hamaguchi, M., Hasumi, R., Ohuchi, K., Ng, H., Zhang, R., Stein, K.J.

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Higher hole mobility induced by twisted Direct Silicon Bonding (DSB) by Hamaguchi, M., Yin, H., Saenger, K.L., Sung, C.Y., Hasumi, R., Iijima, R., Ohuchi, K., Takasu, Y., Ott, J.A., Kang, H., Biscardi, M., Li, J., Domenicucci, A.G., Zhu, Z., Ronsheim, P., Zhang, R., Rovedo, N., Utomo, H., Fogel, K., de Souza, J.P., Sadana, D.K., Takayanagi, M., Park, D., Shahidi, G., Ishimaru, K.

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An epitaxial channel MOSFET for improving flicker noise under low supply voltage by Ohguro, T., Hasumi, R., Ishikawa, T., Nishigori, M., Oyamatsu, H., Matsuoka, F.

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A high performance 100 nm generation SOC technology (CMOS IV) for high density embedded memory and mixed signal LSIs by Miyashita, K., Nakayama, T., Oishi, A., Hasumi, R., Owada, M., Aota, S., Okayama, Y., Matsumoto, M., Igarashi, H., Yoshida, T., Kasai, K., Yoshitomi, T., Fukaura, Y., Kawasaki, H., Ishimaru, K., Adachi, K., Fujiwara, M., Ohuchi, K., Takayanagi, M., Oyamatsu, H., Matsuoka, F., Noguchi, T., Kakumu, M.

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Evaluation technique for EMI anechoic chamber over 1 GHz by plane-wave spectral decomposition and fish-eye lens camera by Ameya, M., Kurokawa, S., Watanabe, I., Yamaguchi, M., Hasumi, R.

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High density and fully compatible embedded DRAM cell with 45nm CMOS technology (CMOS6) by Sanuki, T., Sogo, Y., Oishi, A., Okayama, Y., Hasumi, R., Morimasa, Y., Kinoshita, T., Komoda, T., Tanaka, H., Hiyama, K., Komoguchi, T., Matsumoto, T., Oota, K., Yokoyama, T., Fukasaku, K., Katsumata, R., Kido, M., Tamura, M., Takegawa, Y., Yoshimura, H., Kasai, K., Ohno, K., Saito, M., Aochi, H., Iwai, M., Nagashima, N., Matsuoka, F., Okamoto, Y., Noguchi, T.

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Comprehensive Study on Injection Velocity Enhancement in Dopant-Segregated Schottky MOSFETs by Kinoshita, A., Kinoshita, T., Nishi, Y., Uchida, K., Toriyama, S., Hasumi, R., Koga, J.

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Inflammatory Pseudotumor of the Larynx by Miyamoto, Shunsuke, Inagi, Katsuhide, Motoori, Tadashi, RN, Keiko Hasumi

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Simultaneous EM measurement system using parallel modulated probe array by Qiang Chen, Sawaya, K., Habu, T., Hasumi, R.

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Scaling of 32nm low power SRAM with high-K metal gate by Yang, H.S., Wong, R., Hasumi, R., Gao, Y., Kim, N.S., Lee, D.H., Badrudduza, S., Nair, D., Ostermayr, M., Kang, H., Zhuang, H., Li, J., Kang, L., Chen, X., Thean, A., Arnaud, F., Zhuang, L., Schiller, C., Sun, D.P., Teh, Y.W., Wallner, J., Takasu, Y., Stein, K., Samavedam, S., Jaeger, D., Baiocco, C.V., Sherony, M., Khare, M., Lage, C., Pape, J., Sudijono, J., Steegen, A.L., Stiffler, S.

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Ultra Low Voltage Operations in Bulk CMOS Logic Circuits with Dopant Segregated Schottky Source/Drain Transistors by Kinoshita, T., Hasumi, R., Hamaguchi, M., Miyashita, K., Komoda, T., Kinoshita, A., Koga, J., Adachi, K., Toyoshima, Y., Nakayama, T., Yamada, S., Matsuoka, F.

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Fast Measurement of Radiation Efficiency of Antennas using Parallel Modulated Probe Array by Chen, Qiang, Mizukami, T., Sawaya, K., Watanabe, I., Habu, T., Hasumi, R.

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Fundamental transverse electric field (TE0) mode selection for thin-film asymmetric light guides by Suematsu, Yasuharu, Hakuta, Mitsuari, Furuya, Kazuhito, Chiba, Kazuhiro, Hasumi, Ritsuo

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Effect of End-of-Range Defects on Device Leakage in Direct Silicon Bonded (DSB) Technology by Haizhou Yin, Hamaguchi, M., Saenger, K.L., Sung, C.Y., Hasumi, R., Ohuchi, K., Zhang, R., Cai, J., Ott, J.A., Chen, X., Luo, Z.J., Rovedo, N., Fogel, K., Pfeiffer, G., Kleinhenz, R., Sadana, D.K., Takayanagi, M., Ishimaru, K., Ning, T.H., Park, D.-G., Shahidi, G.

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Scalability of strained silicon CMOSFET and high drive current enhancement in the 40 nm gate length technology by Sanuki, T., Oishi, A., Morimasa, Y., Aota, S., Kinoshita, T., Hasumi, R., Takegawa, Y., Isobe, K., Yoshimura, H., Iwai, M., Sunouchi, K., Noguchi, T.

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Investigating the Causes of the Response of the Thermohaline Circulation to Past and Future Climate Changes by Stouffer, R. J., Yin, J., Gregory, J. M., Dixon, K. W., Spelman, M. J., Hurlin, W., Weaver, A. J., Eby, M., Flato, G. M., Hasumi, H., Hu, A., Jungclaus, J. H., Kamenkovich, I. V., Levermann, A., Montoya, M., Murakami, S., Nawrath, S., Oka, A., Peltier, W. R., Robitaille, D. Y., Sokolov, A., Vettoretti, G., Weber, S. L.

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Loss of Folliculin Disrupts Hematopoietic Stem Cell Quiescence and Homeostasis Resulting in Bone Marrow Failure by Baba, Masaya, Toyama, Hirofumi, Sun, Lei, Takubo, Keiyo, Suh, Hyung‐Chan, Hasumi, Hisashi, Nakamura‐Ishizu, Ayako, Hasumi, Yukiko, Klarmann, Kimberly D., Nakagata, Naomi, Schmidt, Laura S., Linehan, W. Marston, Suda, Toshio, Keller, Jonathan R.

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