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Search Results - Heh, Jack C. K
Search Results - Heh, Jack C. K
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Triphase catalysis. Consideration of catalyst and experimental conditions for simple nucleophilic displacement reactions
by
Regen, Steven L
,
Heh, Jack C. K
,
McLick, Jerome
Published in
Journal of organic chemistry
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Electron transfer through organic structures. 37. Mediation of chromium(II) reductions by bound pyridinedicarboxylate groups in which the coordination position is directed
by
Heh, Jack C. K
,
Gould, Edwin S
Published in
Inorganic chemistry
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Electron transfer. 55. Reductions of pyridinecarboxylato-bridged dicobalt(III) complexes
by
Srinivasan, Vangalur S
,
Rajasekar, N
,
Singh, A. N
,
Radlowski, C. A
,
Heh, Jack C. K
,
Gould, E. S
Published in
Inorganic chemistry
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Electron transfer through organic structures. 38. Blocked pyridinedicarboxylato groups as mediators in the reactions of copper(I) with bound cobalt(III)
by
Heh, Jack C. K
,
Gould, Edwin S
Published in
Inorganic chemistry
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Electron transfer. 33. Rate enhancement by external pyridinedicarboxylato derivatives
by
Fanchiang, Y. T
,
Heh, Jack C. K
,
Gould, Edwin S
Published in
Inorganic chemistry
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Electron transfer. 25. Effectiveness of external catalysts for outer-sphere reactions
by
Fanchiang, Y. T
,
Thomas, Jean C
,
Neff, V. D
,
Heh, Jack C. K
,
Gould, Edwin S
Published in
Inorganic chemistry
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Improved ge surface passivation with ultrathin SiOx enabling high-mobility surface channel pMOSFETs featuring a HfSiO/WN gate stack
by
JOSHI, Sachin
,
KRUG, Cristiano
,
JAMMY, Raj
,
LEE, Jack C
,
BANERJEE, Sanjay K
,
HEH, Dawei
,
HOON JOO NA
,
HARRIS, Harlan R
,
JUNG WOO OH
,
KIRSCH, Paul D
,
MAJHI, Prashant
,
BYOUNG HUN LEE
,
TSENG, Hsing-Huang
Published in
IEEE electron device letters
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Improved Ge Surface Passivation With Ultrathin \hbox Enabling High-Mobility Surface Channel pMOSFETs Featuring a HfSiO/WN Gate Stack
by
Joshi, S.
,
Krug, C.
,
Heh, D.
,
Hoon Joo Na
,
Harris, H.R.
,
Jung Woo Oh
,
Kirsch, P.D.
,
Majhi, P.
,
Byoung Hun Lee
,
Hsing-Huang Tseng
,
Jammy, R.
,
Lee, J.C.
,
Banerjee, S.K.
Published in
IEEE electron device letters
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