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SEU tolerant device, circuit and processor design
by
Heidergott, William
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Radiation Characterization of a Hardened 0.22 $\mu$m Anti-Fuse Field Programmable Gate Array
by
Nejad, R. J.
,
Rickey, P. A.
,
Konadu, K.
,
Stapor, W. J.
,
McDonald, P. T.
,
Heidergott, W.
Published in
IEEE transactions on nuclear science
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Complex SEU signatures in high-speed analog-to-digital conversion
by
Heidergott, W.F.
,
Ladbury, R.
,
Marshall, P.W.
,
Buchner, S.
,
Campbell, A.B.
,
Reed, R.A.
,
Hockmuth, J.
,
Kha, N.
,
Seidleck, C.
,
Assad, A.
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IEEE transactions on nuclear science
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Radiation Characterization of a Hardened 0.22 [mu]m Anti-Fuse Field Programmable Gate Array
by
Nejad, R. J
,
Rickey, P. A
,
Konadu, K
,
Stapor, W. J
,
McDonald, P. T
,
Heidergott, W
Published in
IEEE transactions on nuclear science
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Article
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Radiation Characterization of a Hardened 0.22 \mum Anti-Fuse Field Programmable Gate Array
by
Nejad, R.J.
,
Rickey, P.A.
,
Konadu, K.
,
Stapor, W.J.
,
McDonald, P.T.
,
Heidergott, W.
Published in
IEEE transactions on nuclear science
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