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Search Results - Heo, Dekhyuon
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Cryogenic operation of third-generation, 200-GHz Peak-fT, silicon-germanium heterojunction bipolar transistors
by
BANERJEE, Bhaskar
,
VENKATARAMAN, Sunitha
,
FREEMAN, Greg
,
AHLGREN, David C
,
YUAN LU
,
QINGQING LIANG
,
LEE, Chang-Ho
,
NUTTINCK, Sebastien
,
HEO, Dekhyuon
,
CHEN, Yi-Jan Emery
,
CRESSLER, John D
,
LASKAR, Joy
Published in
IEEE transactions on electron devices
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Cryogenic operation of third-generation, 200-GHz peak-f/sub T/, silicon-germanium heterojunction bipolar transistors
by
Banerjee, B.
,
Venkataraman, S.
,
Yuan Lu
,
Qingqing Liang
,
Chang-Ho Lee
,
Nuttinck, S.
,
Dekhyuon Heo
,
Chen, Y.-J.E.
,
Cressler, J.D.
,
Laskar, J.
,
Freeman, G.
,
Ahlgren, D.C.
Published in
IEEE transactions on electron devices
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Cryogenic operation of third-generation, 200-GHz peak-f sub(T), silicon-germanium heterojunction bipolar transistors
by
Banerjee, B
,
Venkataraman, S
,
Lu, Yuan
,
Liang, Qingqing
,
Lee, Chang-Ho
,
Nuttinck, S
,
Heo, Dekhyuon
,
Chen, Y-JE
,
Cressler, J D
,
Laskar, J
,
Freeman, G
,
Ahlgren, D C
Published in
IEEE transactions on electron devices
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Ieee Transactions On Electron Devices
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Subjects
Broad-Band Noise
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Cryogenic Temperature
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Electronics
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Extreme Environments
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Heterojunction Bipolar Transistor
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Heterojunction Bipolar Transistors
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High-Frequency Noise
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Silicon-Germanium
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Applied Sciences
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Cryogenic Electronics
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Current Measurement
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Devices
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Direct Current
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Exact Sciences And Technology
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Microwave Transistors
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Noise
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Noise Levels
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Semiconductor Device Noise
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Semiconductor Devices
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Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
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Ieee Xplore (Online Service)
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Ieee Xplore All Journals
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