Search Results - Herfst, R
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Characterization of dielectric charging in RF MEMS capacitive switches
Conference Proceeding -
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High-Throughput Atomic Force Microscopes Operating in Parallel
Published in arXiv.orgGet full text
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Identifying degradation mechanisms in RF MEMS capacitive switches
Conference Proceeding -
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Chaos in Electrostatically Actuated RF-MEMS Measured and Modeled
Conference Proceeding -
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