Search Results - Herlambang, Aloysius P.

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  1. 1
    Analysis and Modeling for Reverse Body Bias Stress Impact on HCI Induced Degradation in n-Type EDMOS

    Analysis and Modeling for Reverse Body Bias Stress Impact on HCI Induced Degradation in n-Type EDMOS by Cai, Miao, Leang, Sern Ee, Wai Chew, Kok, Tan, Pee Ya, Herlambang, Aloysius P., Zhu, Chunxiang, Guo, Yongxin

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    LDMOS Thermal SOA Investigation of a Novel 800V Multiple RESURF with Linear P-top Rings

    LDMOS Thermal SOA Investigation of a Novel 800V Multiple RESURF with Linear P-top Rings by Herlambang, Aloysius P., Sheu, Gene, Guo, Yufeng, Wasisto, Hutomo Suryo

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