Effect of hydrophobically modified graphene oxide on the properties of poly(3-hydroxybutyrate-co-4-hydroxybutyrate) by Larsson, Matilda, Hetherington, Crispin J.D., Wallenberg, Reine, Jannasch, Patric

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Aberration-Corrected Imaging of Active Sites on Industrial Catalyst Nanoparticles by Gontard, Lionel Cervera, Chang, Lan-Yun, Hetherington, Crispin J. D., Kirkland, Angus I., Ozkaya, Dogan, Dunin-Borkowski, Rafal E.

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Exploring the fundamental effects of deposition time on the microstructure of graphene nanoflakes by Raman scattering and X-ray diffraction by Soin, Navneet, Roy, Susanta Sinha, O'Kane, Christopher, McLaughlin, James A. D, Lim, Teck H, Hetherington, Crispin J. D

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A versatile double aberration-corrected, energy filtered HREM/STEM for materials science by Hutchison, John L., Titchmarsh, John M., Cockayne, David J.H., Doole, Ron C., Hetherington, Crispin J.D., Kirkland, Angus I., Sawada, H.

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Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires by Ek, Martin, Borgström, Magnus T., Karlsson, Lisa S., Hetherington, Crispin J.D., Wallenberg, L. Reine

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High-Resolution TEM and the Application of Direct and Indirect Aberration Correction by Hetherington, Crispin J.D., Chang, Lan-Yun Shery, Haigh, Sarah, Nellist, Peter D., Gontard, Lionel Cervera, Dunin-Borkowski, Rafal E., Kirkland, Angus I.

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Contributions of Inelastically Scattered Electrons to Defect Images by Kirk, M. A., Twesten, R., Martin, S. P., Hetherington, C. J. D., Jenkins, M. L.

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The nature and origin of interstellar diamond by Blake, David F., Freund, Friedemann, Shipp, Ruth, Krishnan, Kannan F. M., Echer, Charles J.

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Sub-Ångstrom Resolution with a Mid-Voltage TEM by O'Keefe, Michael A., Hetherington, Crispin J.D., Chris Nelson, E.

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Laboratory Design for High-Performance Electron Microscopy by O'Keefe, Michael A., Turner, John H., Musante, John A., Hetherington, Crispin J.D., Cullis, A.G., Carragher, Bridget, Jenkins, Ron, Milgrim, Julie, Milligan, Ronald A., Potter, Clinton S., Allard, Lawrence F., Blom, Douglas A., Degenhardt, Lynn, Sides, William H.

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Bismuth-oxide nanoparticles: study in a beam and as deposited by Mikkelä, M.-H, Marnauza, M, Hetherington, C. J. D, Wallenberg, R, Mårsell, E, Liu, Yen-Po, Mikkelsen, A, Björneholm, O, Öhrwall, G, Tchaplyguine, M

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Materials Advances through Aberration-Corrected Electron Microscopy by Pennycook, S.J., Varela, M., Hetherington, C.J.D., Kirkland, A.I.

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Cs Corrector for Illumination by Sawada, Hidetaka, Tomita, Takeshi, Naruse, Mikio, Honda, Toshikazu, Hartel, Peter, Haider, Max, Hetherington, Crispin J D, Doole, Ron C, Kirkland, Angus I, Hutchison, John L, Titchmarsh, John M, Cockayne, David J H

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Cs Corrector for Imaging by Sawada, Hidetaka, Tomita, Takeshi, Kaneyama, Toshikatsu, Hosokawa, Fumio, Naruse, Mikio, Honda, Toshikazu, Hartel, Peter, Haider, Max, Tanaka, Nobuo, Hetherington, Crispin J D, Doole, Ron C, Kirkland, Angus I, Hutchison, John L, Titchmarsh, John M, Cockayne, David J H

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