Gate-drain charge analysis for switching in power trench MOSFETs by Hueting, R.J.E., Hijzen, E.A., Heringa, A., Ludikhuize, A.W., Zandt, M.A.Ai

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Impact of downscaling and poly-gate depletion on the RF noise parameters of advanced nMOS transistors by Nuttinck, S., Scholten, A.J., Tiemeijer, L.F., Cubaynes, F., Dachs, C., Detcheverry, C., Hijzen, E.A.

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Using thin emitters to control BV ce0 effects in punch-through diodes for ESD protection by van Dalen, R, Hurkx, G.A.M, in ‘t Zandt, M.A.A, Hijzen, E.A, Weijs, P.J.W, den Dekker, A

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Using thin emitters to control BVce0 effects in punch-through diodes for ESD protection by van Dalen, R, Hurkx, G.A.M, in ‘t Zandt, M.A.A, Hijzen, E.A, Weijs, P.J.W, den Dekker, A

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Avalanche Cold Cathodes with 10% Emission Efficiency by Hijzen, E.A., Kaiser, M.

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Low-voltage SiGe power diodes by Hurkx, G.A.M., Hijzen, E.A., 't Zandt, M.A.A.

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Optimisation of N-Channel Trench MOS for Power Applications by Hueting, R.J.E., Hurkx, G.A.M., Hijzen, E.A., Hodgskiss, S.W., Gajda, M.

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New ideas for two dimensional position sensitive silicon drift detectors by Hijzen, E.A., Schooneveld, E.M., van Eijk, C.W.E., Hollander, R.W., Sarro, P.M., van den Bogaard, A.

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A Novel Fully Self-Aligned SiGe:C HBT Architecture Featuring a Single-Step Epitaxial Collector-Base Process by Donkers, J.J.T.M., Vanhoucke, T., Vleugels, F., Winderickx, G., Kunnen, E., Peeters, S., Baute, D., De Vos, B., Vandeweyer, T., Loo, R., Venegas, R., Kramer, M.C.J.C.M., Pijper, R., Voogt, F.C., Decoutere, S., Hijzen, E.A., Van Huylenbroeck, S., Choi, L.J., Meunier-Beillard, P., Sibaja-Hernandez, A., Boccardi, G., van Noort, W., Hurkx, G.A.M.

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Switching performance of low-voltage N-channel trench MOSFETs by Hueting, R.J.E., Hijzen, E.A., Ludikhuize, A.W., 't Zandt, M.A.A.

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New Silicon Drift Detector Design With Two Dimensional Drift Time Measurement by Hijzen, E.A., Schooneveld, E.M., van Eijk, C.W.E., Hollander, R.W., Sarro, P.M., van den Bogaard, A.

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Results of a new silicon drift detector design for diminishing lateral diffusion by Hijzen, E.A., Schooneveld, E.M., van Eijk, C.W.E., Hollander, R.W., Sarro, P.M., van den Bogaard, A.

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