Search Results - Hild, Erzsébet

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  1. 1
    Contact angle determination of nanoparticles: film balance and scanning angle reflectometry studies

    Contact angle determination of nanoparticles: film balance and scanning angle reflectometry studies by Deák, András, Hild, Erzsébet, Kovács, Attila Lajos, Hórvölgyi, Zoltán

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  2. 2
    Combined Langmuir–Blodgett and sol-gel coatings

    Combined Langmuir–Blodgett and sol-gel coatings by Detrich, Ádám, Hild, Erzsébet, Nagy, Norbert, Volentiru, Emőke, Hórvölgyi, Zoltán

    Published in Thin solid films
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  3. 3
    Langmuir and Langmuir−Blodgett Films of Bidisperse Silica Nanoparticles

    Langmuir and Langmuir−Blodgett Films of Bidisperse Silica Nanoparticles by Detrich, Ádám, Deák, András, Hild, Erzsébet, Kovács, Attila L, Hórvölgyi, Zoltán

    Published in Langmuir
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  4. 4
    Complex Langmuir−Blodgett Films of SiO2 and ZnO Nanoparticles with Advantageous Optical and Photocatalytical Properties

    Complex Langmuir−Blodgett Films of SiO2 and ZnO Nanoparticles with Advantageous Optical and Photocatalytical Properties by Nagy, Lívia Naszályi, Ábrahám, Nóra, Sepsi, Örs, Hild, Erzsébet, Cot, Didier, Ayral, André, Hórvölgyi, Zoltán

    Published in Langmuir
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  5. 5
    Complex Langmuir−Blodgett Films of SiO 2 and ZnO Nanoparticles with Advantageous Optical and Photocatalytical Properties

    Complex Langmuir−Blodgett Films of SiO 2 and ZnO Nanoparticles with Advantageous Optical and Photocatalytical Properties by Nagy, Lívia Naszályi, Ábrahám, Nóra, Sepsi, Örs, Hild, Erzsébet, Cot, Didier, Ayral, André, Hórvölgyi, Zoltán

    Published in Langmuir
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  6. 6
    Contact angle determination of nanoparticles : film balance and scanning angle reflectometry studies: Colloidal particles at liquid interfaces

    Contact angle determination of nanoparticles : film balance and scanning angle reflectometry studies: Colloidal particles at liquid interfaces by DEAK, Andras, HILD, Erzsébet, LAJOS KOVACS, Attila, HORVOLGYI, Zoltan

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  7. 7
    Calculation of the infrared reflection spectra of inhomogeneously doped silicon semiconductor layers at an arbitrary angle of incidence

    Calculation of the infrared reflection spectra of inhomogeneously doped silicon semiconductor layers at an arbitrary angle of incidence by HILD, E, EVANS, M. W

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  8. 8
    A graphical method for determining the parameters of a diffusion profile in silicon by infrared reflection spectroscopy

    A graphical method for determining the parameters of a diffusion profile in silicon by infrared reflection spectroscopy by Hild, Erzsébet, Vij, Jagdish K., Corcoran, Patrick, Végh, Gerzson

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