Search Results - Hillbrich, S

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    Analysis of the depth homogeneity of p-PS by reflectance measurements

    Analysis of the depth homogeneity of p-PS by reflectance measurements by Thönissen, M, Berger, M.G, Billat, S, Arens-Fischer, R, Krüger, M, Lüth, H, Theiß, W, Hillbrich, S, Grosse, P, Lerondel, G, Frotscher, U

    Published in Thin solid films
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