Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction by Hiller, Kieran P, Winkelmann, Aimo, Hourahine, Ben, Starosta, Bohdan, Alasmari, Aeshah, Feng, Peng, Wang, Tao, Parbrook, Peter J, Zubialevich, Vitaly Z, Hagedorn, Sylvia, Walde, Sebastian, Weyers, Markus, Coulon, Pierre-Marie, Shields, Philip A, Bruckbauer, Jochen, Trager-Cowan, Carol

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