Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability by Hirler, A., Biba, J., Alsioufy, A., Lehndorff, T., Sulima, T., Lochner, H., Abelein, U., Hansch, W.

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Experimental reliability study of cumulative damage models on state-of-the-art semiconductor technologies for step-stress tests and mission profile stresses by Hirler, A., Biba, J., Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, T., Wiatr, M., Hansch, W.

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Effective and combined stressors from multi-dimensional mission profiles for semiconductor reliability by Hirler, A., Alsioufy, A., Biba, J., Lehndorff, T., Lochner, H., Simon, S., Sulima, T., Thomas, W., Hansch, W.

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Mission Profile Clustering Using a Universal Quantile Criterion by Hirler, A., Abelein, U., Buttner, M., Fischbach, R., Jerke, G., Krinke, A., Simon, S.

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Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability by Hirler, A., Alsioufy, A., Biba, J., Lehndorff, T., Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, T., Wiatr, M., Hansch, W.

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Correlated Chemical and Electrically Active Dopant Analysis in Catalyst-Free Si-Doped InAs Nanowires by Becker, Jonathan, Hill, Megan O, Sonner, Max, Treu, Julian, Döblinger, Markus, Hirler, Alexander, Riedl, Hubert, Finley, Jonathan J, Lauhon, Lincoln, Koblmüller, Gregor

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DNA: A Programmable Force Sensor by Albrecht, Christian, Blank, Kerstin, Lalic-Mülthaler, Mio, Hirler, Siegfried, Mai, Thao, Gilbert, Ilka, Schiffmann, Susanne, Bayer, Tom, Clausen-Schaumann, Hauke, Gaub, Hermann E.

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Simulation of a Short-Circuit Rugged Trench IGBT with a JFET Connected to a SiC Schottky Rectifier by Arnold, Thorsten, Elpelt, Rudolf, Thees, Hans-Jurgen, Imperiale, Ilaria, Philippou, Alexander, Hirler, Franz, Hauf, Moritz, Baburske, Roman, Sandow, Christian

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YFET - Trench superjunction process window extended by Hirler, F., Kapels, H.

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Single-particle excitations in quasi-zero- and quasi-one-dimensional electron systems by Strenz, R, Bockelmann, U, Hirler, F, Abstreiter, G, Böhm, G, Weimann, G

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Double-chip protein arrays: force-based multiplex sandwich immunoassays with increased specificity by Blank, Kerstin, Lankenau, Andreas, Mai, Thao, Schiffmann, Susanne, Gilbert, Ilka, Hirler, Siegfried, Albrecht, Christian, Benoit, Martin, Gaub, Hermann E, Clausen-Schaumann, Hauke

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Avalanche breakdown capability of Power DMOS Transistors and the Wunsch-Bell relation by Deckelmann, A.Icaza, Wachutka, G., Hirler, F., Krumrey, J., Henninger, R.

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Chiral Nonlinear Polaritonics with van der Waals Metasurfaces by Connor Heimig, Antonov, Alexander A, Gryb, Dmytro, Possmayer, Thomas, Weber, Thomas, Hirler, Michael, Biechteler, Jonas, Sortino, Luca, de S Menezes, Leonardo, Maier, Stefan A, Gorkunov, Maxim V, Kivshar, Yuri, Tittl, Andreas

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Failure of multiple-cell power DMOS transistors in avalanche operation by Deckelmann, A.C., Wachutka, G., Hirler, F., Krumrey, J., Henninger, R.

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UIS-Failure of DMOS Power Transistors by Deckelmann, A.I., Wachutka, G., Hirler, F., Krumrey, J.

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Energy levels in quantum wires studied by tunneling and magnetotransport experiments by HIRLER, F, SMOLINER, J, GORNIK, E, WEIMANN, G, SCHLAPP, W

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Confined plasmons in shallow etched quantum wires by Strenz, R, Rosskopf, V, Hirler, F, Abstreiter, G, Bohm, G, Trankle, G, Weimann, G

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Space-saving edge-termination structures for vertical charge compensation devices by Siemieniec, R., Hirler, F., Geissler, C.

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One-dimensional charge density determination in shallow etched quantum wires by Smoliner, J, Berthold, G, Hirler, F, Reinacher, N

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Spatially direct and indirect optical transitions in shallow etched GaAs/AlGaAs quantum wires by Hirler, F., Küchler, R., Strenz, R., Abstreiter, G., Böhm, G., Smoliner, J., Tränkle, G., Weimann, G.

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