Search Results - Hochwitz, T.

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    Scanning probe microscopy for 2-D semiconductor dopant profiling and device failure analysis

    Scanning probe microscopy for 2-D semiconductor dopant profiling and device failure analysis by Henning, A.K., Hochwitz, T.

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    DRAM failure analysis with the force-based scanning Kelvin probe

    DRAM failure analysis with the force-based scanning Kelvin probe by Hochwitz, T., Henning, A.K., Daghlian, C., Bolam, R., Coutu, P., Gluck, R., Slinkman, J.

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  3. 3
    Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy

    Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy by Henning, Albert K., Hochwitz, Todd, Slinkman, James, Never, James, Hoffmann, Steven, Kaszuba, Phil, Daghlian, Charles

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