Search Results - Hok-Min Ho

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  1. 1
    Impact of geometrical scaling on parasitic pnp bipolar transistor in N-well, 0.25 μm CMOS devices and its effect on latchup immunity

    Impact of geometrical scaling on parasitic pnp bipolar transistor in N-well, 0.25 μm CMOS devices and its effect on latchup immunity by Leong, Kam-Chew, Lin, Po-Ching, Ho, Hok-Min, Gan, Chock-Ming, Chan, Lap

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  2. 2
    Experimental Study of Si3 N 4 Viscosity for Calibration of Stress‐Dependent Models of Silicon Oxidation

    Experimental Study of Si3 N 4 Viscosity for Calibration of Stress‐Dependent Models of Silicon Oxidation by Loiko, Konstantin V., Peidous, Igor V., Zu, Yue, Ho, Hok‐Min

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  3. 3
    Experimental study of Si3N4 viscosity for calibration of stress-dependent models of silicon oxidation

    Experimental study of Si3N4 viscosity for calibration of stress-dependent models of silicon oxidation by LOIKO, K. V, PEIDOUS, I. V, YUE ZU, HO, H.-M

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  4. 4
    Methodology for ULSI LOCOS isolation built-in reliability analysis

    Methodology for ULSI LOCOS isolation built-in reliability analysis by Loiko, K.V., Peidous, I.V., Hok-Min Ho, Quek, E.K.B., Lim, D.H.Y.

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  5. 5
    Fingerprints and age models for widespread New Zealand tephra marker beds erupted since 30,000 years ago: a framework for NZ-INTIMATE

    Fingerprints and age models for widespread New Zealand tephra marker beds erupted since 30,000 years ago: a framework for NZ-INTIMATE by Lowe, David J., Shane, Phil A.R., Alloway, Brent V., Newnham, Rewi M.

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