Search Results - Holoboff, R.

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  1. 1
    Statistical and transient channel modeling for crosstalk, bit error, jitter, and EMI

    Statistical and transient channel modeling for crosstalk, bit error, jitter, and EMI by Barnes, G., Mellitz, R.I., Tsuk, M., Holoboff, R., Pytel, S.G.

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    Effects of microstructure on flux pinning in epitaxial YBa2Cu3Ox films

    Effects of microstructure on flux pinning in epitaxial YBa2Cu3Ox films by KIM, D. H, MILLER, D. J, SMITH, J. C, HOLOBOFF, R. A, KANG, J. H, TALVACCHIO, J

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    Effects of microstructure on flux pinning in epitaxial YBa 2 Cu 3 O x films

    Effects of microstructure on flux pinning in epitaxial YBa 2 Cu 3 O x films by Kim, D. H., Miller, D. J., Smith, J. C., Holoboff, R. A., Kang, J. H., Talvacchio, J.

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