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Search Results - Holverson, P.J.
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Application of force fill Al-plug technology to 64 Mb DRAM and 0.35 /spl mu/m logic
by
Mizobuchi, K.
,
Hamamoto, K.
,
Utsugi, M.
,
Dixit, G.A.
,
Poarch, S.
,
Havemann, R.H.
,
Dobson, C.D.
,
Jeffryes, A.I.
,
Holverson, P.J.
,
Rich, P.
,
Butler, D.C.
,
Rimmer, N.
,
McGeown, A.
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A novel high pressure low temperature aluminum plug technology for sub-0.5 /spl mu/m contact/via geometries
by
Dixit, G.A.
,
Chisholm, M.F.
,
Jain, M.K.
,
Weaver, T.
,
Ting, L.M.
,
Pearch, S.
,
Mizobuchi, K.
,
Havemann, R.H.
,
Dobson, C.D.
,
Jeffryes, A.I.
,
Holverson, P.J.
,
Rich, P.
,
Butler, D.C.
,
Hems, J.
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Conference Proceeding
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Conference Proceedings
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Aluminum
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Filling
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Plugs
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Collimators
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Contacts
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Integrated Circuit Interconnections
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Integrated Circuit Reliability
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Integrated Circuit Yield
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Logic Devices
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Nonhomogeneous Media
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Plasma Applications
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Plasma Temperature
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Random Access Memory
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Sputter Etching
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Tin
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Ultra Large Scale Integration
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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