Machine vision inspection of early failure and line-shaped defects of blue InGaN/GaN light emitting diodes soaked in liquid nitrogen for cryogenic tests by Yang, Chun-Yen, Yu, Chih-Yuan, Lin, You-Li, Hon, Mou-Tuong, Yang, Shao-Jui, Zhang, Yi-Zong, Kang, Hsuan-Chia, Kuo, Yaw-Wen, Lin, Chia-Feng, Wu, You-Lin, Chou, Hsin-Hung, Chen, Hsiang, Li, Yung-Hui, Han, Jung

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