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    A Compact Test Structure for Characterizing Transistor Variability Beyond 3\sigma

    A Compact Test Structure for Characterizing Transistor Variability Beyond 3\sigma by Chen, Christopher S., Liping Li, Lim, Queennie, Hong HaiTeh, Binti Omar, Noor Fadillah, Chun-Lee Ler, Watt, Jeffrey T.

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