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Cost-effective memory protection and reliability evaluation based on machine error-tolerance: A case study on no-accuracy-loss YOLOv4 object detection model
by
Hsieh, Tong-Yu
,
Tsai, Ching-Yeh
,
Hou, Sian-Jhang
,
Chao, Wei-Ji
Published in
Microelectronics and reliability
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Microelectronics And Reliability
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Ecc
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Engineering
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Engineering, Electrical & Electronic
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Machine Error-Tolerance
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Memory Protection
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Nanoscience & Nanotechnology
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Object Detection
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Reliability
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