Search Results - Hsieh, Brian Yueh-Ling

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  1. 1
    Electron Beam Inspection in Physical Mode: Overpolish Monitoring of RMG CMP

    Electron Beam Inspection in Physical Mode: Overpolish Monitoring of RMG CMP by Hafer, Richard F, Lin, Hong, Stamper, Andrew, Hsieh, Brian Yueh-Ling, Hsieh, Jerry

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  2. 2
    Electron Beam Inspection: Within Die and Within- Wafer monitoring of RMG CMP

    Electron Beam Inspection: Within Die and Within- Wafer monitoring of RMG CMP by Hafer, Richard F., Lin, Hong, Hsieh, Brian Yueh-Ling

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  3. 3
    Electron beam inspection: CDU dual-mode inspection and lithography ghost image detection

    Electron beam inspection: CDU dual-mode inspection and lithography ghost image detection by Hafer, Richard F., Patterson, Oliver D., McKindles, Derek, Hsieh, Brian Yueh-Ling

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    In-line characterization of EDRAM for a FINFET technology using VC inspection

    In-line characterization of EDRAM for a FINFET technology using VC inspection by Patterson, Oliver D., Hafer, Richard, Mittal, Surbhi, Arya, Ankur, Stein, Kenneth, Ho, Herbert, Davies, William, Tang, Xiaohu, Hsieh, Brian Yueh-Ling, Lei, Shuen-Cheng Chris

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  5. 5
    Solved: the mystery of bright voltage contrast word-line defects for SOI technology using nanoprobing

    Solved: the mystery of bright voltage contrast word-line defects for SOI technology using nanoprobing by Patterson, Oliver D., Hafer, Richard F., Pendyala, Sweta, Song, Zhigang, Hsieh, Brian Yueh-Ling, Tang, Xiaohu

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