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Measurement and modeling of the sidewall threshold voltage of mesa-isolated SOI MOSFETs
by
Matloubian, M.
,
Sundaresan, R.
,
Lu, H.
Published in
IEEE transactions on electron devices
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Characterization of the effects of different capping layer structures on the laser recrystallization of silicon by using electrical test structures and Raman spectroscopy
by
LU, H. E
,
BOYD, J. T
,
JACKSON, H. E
,
JANNING, J. L
Published in
Journal of applied physics
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A radiation hardened 1-M bit SRAM on SIMOX material
by
Houston, T.
,
Hsindao Lu
,
Yee, E.
,
Hite, L.
,
Rajgopal, R.
,
Shen, C.C.
,
Jeong-Mo Hwang
,
Pollack, G.
,
Cohn, L.
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A 1-M bit SRAM on SIMOX material
by
Hsindao Lu
,
Yee, E.
,
Hite, L.
,
Houston, T.
,
Yea-Dean Sheu
,
Rajgopal, R.
,
Shen, C.C.
,
Jeong-Mo Hwang
,
Pollack, G.
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Ieee Transactions On Electron Devices
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Journal Of Applied Physics
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Circuit Synthesis
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Cmos Memory Circuits
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Condensed Matter: Structure, Mechanical And Thermal Properties
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Ieee Electronic Library (Iel) Conference Proceedings
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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Ieee Xplore (Online Service)
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Ieee Xplore All Journals
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Aip 美国物理联合会期刊回溯(Nstl购买)
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Aip - American Institute Of Physics
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