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Influence of structural defects on thermostability and radiation sensitivity of Si MOSFET dosimeters
by
Smyntyna, V.A.
,
Kulinich, O.A.
,
Iatsunskyi, I.R.
,
Marchuk, I.A.
Published in
Radiation measurements
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Radiation Measurements
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Charge
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Crystal Defects
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Dislocations
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Dosimeters
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Isotope Geochemistry. Geochronology
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Metal Oxide Semiconductors
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Mosfet Detector
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Mosfets
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Nuclear Science & Technology
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Radiation Sensitivity
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