Extending two-element capacitance extraction method toward ultraleaky gate oxides using a short-channel length by Jung-Suk Goo, Mantei, T., Wieczorek, K., En, W.G., Icel, A.B.

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Switching-mode dependence of inductive noise in VLSI power bus lines by Jung-Suk Goo, Hale, S., Zamudio, L., Pelella, M.M., Klein, R., Butler, S., Judy Xilin An, Lee, M., Icel, A.B.

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SPICE parameter extraction and RO validation of a 65nm SOI technology by Goo, J.-S., Chen, Q., Pandey, A., Apanovich, Y., Ly, T., Wason, V., Subba, N., Thuruthiyil, C., Icel, A.B.

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Extraction of Self-Heating Free I-V Curves Including the Substrate Current of PD SOI MOSFETs by Qiang Chen, Zhi-Yuan Wu, Su, R.Y.K., Jung-Suk Goo, Thuruthiyil, C., Radwin, M., Subba, N., Suryagandh, S., Tran Ly, Wason, V., An, J.X., Icel, A.B.

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Impact of stress on various circuit characteristics in 65nm PDSOI technology by Suryagandh, S., Gupta, M., Zhi-Yuan Wu, Krishnan, S., Pelella, M., Jung-Suk Goo, Thuruthiyil, C., An, J.X., Chen, B.Q., Subba, N., Zamudio, L., Yonemura, J., Icel, A.B.

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Impact of stress on various circuit characteristics in 65nm PDSOI technology by Suryagandh, S., Gupta, M., Zhi-Yuan Wu, Krishnan, S., Pelella, M., Jung-Suk Goo, Thuruthiyil, C., An, J.X., Chen, B.Q., Subba, N., Zamudio, L., Yonemura, J., Icel, A.B.

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Off-state leakage current modeling in low-power/high-performance partially-depleted (PD) floating-body (FB) SOI MOSFETs by Qiang Chen, Jung-Suk Goo, Tran Ly, Chandrasekaran, K., Zhi-Yuan Wu, Thuruthiyil, C., Icel, A.B.

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Critical current (ICRIT) based SPICE model extraction for SRAM cell by Qiang Chen, Balasubramanian, S., Thuruthiyil, C., Gupta, M., Wason, V., Subba, N., Jung-Suk Goo, Chiney, P., Krishnan, S., Icel, A.B.

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Extraction of speculative SOI MOSFET models using self-heating-free targets by Qiang Chen, Zhi-Yuan Wu, Ly, T., Gupta, M., Wason, V., Jung-Suk Goo, Thuruthiyil, C., Radwin, M., Subba, N., Chiney, P., Suryagandh, S., Icel, A.B.

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History-effect-conscious SPICE model extraction for PD-SOI technology by Goo, J.-S., An, J.X., Thuruthiyil, C., Ly, T., Chen, Q., Radwin, M., Zhi-Yuan Wu, Lee, M.S.L., Zamudio, L., Yonemura, J., Assad, F., Pelella, M.M., Icel, A.B.

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