Search Results - Iellina, Matteo

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  1. 1
    An Efficient Nonlocal Hot Electron Model Accounting for Electron-Electron Scattering

    An Efficient Nonlocal Hot Electron Model Accounting for Electron-Electron Scattering by Zaka, A., Palestri, P., Rafhay, Q., Clerc, R., Iellina, M., Rideau, D., Tavernier, C., Pananakakis, G., Jaouen, H., Selmi, L.

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  2. 2
    Effect of the choice of the tunnelling path on semi-classical numerical simulations of TFET devices

    Effect of the choice of the tunnelling path on semi-classical numerical simulations of TFET devices by De Michielis, Luca, Iellina, Matteo, Palestri, Pierpaolo, Ionescu, Adrian M., Selmi, Luca

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  3. 3
    A Simulation Study of the Punch-Through-Assisted Hot Hole Injection Mechanism for Nonvolatile Memory Cells

    A Simulation Study of the Punch-Through-Assisted Hot Hole Injection Mechanism for Nonvolatile Memory Cells by Iellina, Matteo, Palestri, Pierpaolo, Akil, Nader, van Duuren, Michiel J, Driussi, Francesco, Esseni, David, Selmi, Luca

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  4. 4
    On the accuracy of current TCAD hot carrier injection models in nanoscale devices

    On the accuracy of current TCAD hot carrier injection models in nanoscale devices by Zaka, Alban, Rafhay, Quentin, Iellina, Matteo, Palestri, Pierpaolo, Clerc, Raphaël, Rideau, Denis, Garetto, Davide, Dornel, Erwan, Singer, Julien, Pananakakis, Georges, Tavernier, Clément, Jaouen, Hervé

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  5. 5
    Tunneling path impact on semi-classical numerical simulations of TFET devices

    Tunneling path impact on semi-classical numerical simulations of TFET devices by De Michielis, L, Iellina, M, Palestri, P, Ionescu, A M, Selmi, L

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  6. 6
    Programming efficiency and drain disturb trade-off in embedded Non Volatile Memories

    Programming efficiency and drain disturb trade-off in embedded Non Volatile Memories by Zaka, A, Palestri, P, Rideau, D, Iellina, M, Dornel, E, Rafhay, Q, Tavernier, C, Jaouen, H

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