Hardness-by-design approach for 0.15 mu m fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunity by Makihara, A, Midorikawa, M, Yamaguchi, T, Iide, Y, Yokose, T, Tsuchiya, Y, Arimitsu, T, Asai, H, Shindou, H, Kuboyama, S, Matsuda, S

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Single-event effects in 0.18 mu m CMOS commercial processes by Makihara, A, Sakaide, Y, Tsuchiya, Y, Arimitsu, T, Asai, H, Iide, Y, Shindou, H, Kuboyama, S, Matsuda, S

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SEE in a 0.15 mu m fully depleted CMOS/SOI commercial Process by Makihara, A, Yamaguchi, T, Tsuchiya, Y, Arimitsu, T, Asai, H, Iide, Y, Shindou, H, Kuboyama, S, Matsuda, S

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Factores vinculados con la aceptación de la violencia en educación secundaria en México by Pedroza Zúñiga, Luis Horacio, Gómez Monarrez, César, Rodríguez Figueroa, Héctor Manuel

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SEE in a 0.15 /spl mu/m fully depleted CMOS/SOI commercial Process by Makihara, A., Yamaguchi, T., Tsuchiya, Y., Arimitsu, T., Asai, H., Iide, Y., Shindou, H., Kuboyama, S., Matsuda, S.

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Hardness-by-design approach for 0.15 mum fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunity by Makihara, A, Midorikawa, M, Yamaguchi, T, Iide, Y, Yokose, T, Tsuchiya, Y, Arimitsu, T, Asai, H, Shindou, H, Kuboyama, S, Matsuda, S

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Hardness-by-design approach for 0.15 [micro]m fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunity by Makihara, A, Midorikawa, M, Yamaguchi, T, Iide, Y, Yokose, T, Tsuchiya, Y, Arimitsu, T, Asai, H, Shindou, H, Kuboyama, S, Matsuda, S

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Hardness-by-design approach for 0.15 /spl mu/m fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunity by Makihara, A., Midorikawa, M., Yamaguchi, T., Iide, Y., Yokose, T., Tsuchiya, Y., Arimitsu, T., Asai, H., Shindou, H., Kuboyama, S., Matsuda, S.

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SEE in a 0.15 [micro]m fully depleted CMOS/SOI commercial Process by Makihara, A, Yamaguchi, T, Tsuchiya, Y, Arimitsu, T, Asai, H, Iide, Y, Shindou, H, Kuboyama, S, Matsuda, S

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SEE in a 0.15 mum fully depleted CMOS/SOI commercial Process by Makihara, A, Yamaguchi, T, Tsuchiya, Y, Arimitsu, T, Asai, H, Iide, Y, Shindou, H, Kuboyama, S, Matsuda, S

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Single-event effects in 0.18 mum CMOS commercial processes by Makihara, A, Sakaide, Y, Tsuchiya, Y, Arimitsu, T, Asai, H, Iide, Y, Shindou, H, Kuboyama, S, Matsuda, S

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Single-event effects in 0.18 /spl mu/m CMOS commercial processes by Makihara, A., Sakaide, Y., Tsuchiya, Y., Arimitsu, T., Asai, H., Iide, Y., Shindou, H., Kuboyama, S., Matsuda, S.

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Single-event effects in 0.18 [micro]m CMOS commercial processes by Makihara, A, Sakaide, Y, Tsuchiya, Y, Arimitsu, T, Asai, H, Iide, Y, Shindou, H, Kuboyama, S, Matsuda, S

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Correlation between proton and heavy-ion SEUs in commercial memory devices by Chiba, K., Nashiyama, I., Sugimoto, K., Nemoto, N., Asai, H., Iide, Y., Shindo, H., Ikeda, N., Kuboyama, S., Matsuda, S.

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Terrestrial neutron-induced single-event burnout in SiC power diodes by Asai, H., Sugimoto, K., Nashiyama, I., Iide, Y., Shiba, K., Matsuda, M., Miyazaki, Y.

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Design and development status of the EarthCARE Cloud Profiling Radar by Nakatsuka, H., Kimura, T., Seki, Y., Kadosaki, G., Iide, Y., Okada, K., Yamaguchi, J., Takahashi, N., Ohno, Y., Horie, H., Sato, K.

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High-Density Lipoprotein Cholesterol Subfractions and Lecithin: Cholesterol Acyltransferase Activity in Collegiate Soccer Players by Imamura, H., Nagata, A., Oshikata, R., Yoshimura, Y., Miyamoto, N., Miyahara, K., Oda, K., Iide, K.

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High-Density Lipoprotein Cholesterol Subtractions and Lecithin: Cholesterol Acyltransferase Activity in Collegiate Soccer Players by Imamura, H, Nagata, A, Oshikata, R, Yoshlmura, Y, Miyamoto, N, Mlyahara, K, Oda, K, Iide, K

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Physical Activity, Physical Fitness and Coronary Heart Disease Risk Factors in Collegiate Women by Imamura, Hiroyuki, Yoshimura, Yoshitaka, Okishima, Kyota, Iide, Kazuhide, Masuda, Reika, Noda, Yuka, Kishida, Reina, Nagata, Atsumi

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Physiological Responses of Simulated Karate Sparring Matches in Young Men and Boys by Iide, Kazuhide, Imamura, Hiroyuki, Yoshimura, Yoshitaka, Yamashita, Asuka, Miyahara, Keiko, Miyamoto, Noriko, Moriwaki, Chinatsu

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