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Search Results - Illera-Gomez, Ivan
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How the Analysis of Archival Data Could Provide Helpful Information About TID Degradation. Case Study: Bipolar Transistors
by
Martin-Holgado, Pedro
,
Romero-Maestre, Amor
,
de-Martin-Hernandez, Jose
,
Gonzalez-Lujan, Jose J.
,
Illera-Gomez, Ivan
,
Jimenez-de-Luna, Yolanda
,
Morilla, Fernando
,
Barbero, Mario Sacristan
,
Alia, Ruben Garcia
,
Dominguez, Manuel
,
Morilla, Yolanda
Published in
IEEE transactions on nuclear science
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Ieee Transactions On Nuclear Science
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And Electromechanical Parts Database
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Bipolar Transistors
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Commercial Off-The-Shelf
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Data Analysis
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Degradation
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Electrical
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Electronic Components
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Gain Degradation
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Lot-To-Lot Variability
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Machine Learning
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