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Electron and hole mobility in silicon at large operating temperatures - Part I: Bulk mobility
by
Reggiani, Susanna
,
Valdinoci, Marina
,
Colalongo, Luigi
,
Rudan, Massimo
,
Baccarani, Giorgio
,
Stricker, Andreas D
,
Illien, Fridolin
,
Felber, Norbert
,
Fichtner, Wolfgang
,
Zullino, Lucia
Published in
IEEE transactions on electron devices
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Ieee Transactions On Electron Devices
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Charge Carrier Mobility
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