Search Results - Imhof, Michael E.

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  1. 1
    High-Throughput Logic Timing Simulation on GPGPUs

    High-Throughput Logic Timing Simulation on GPGPUs by Holst, Stefan, Imhof, Michael E., Wunderlich, Hans-Joachim

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  2. 2
    Efficient multi-level fault simulation of HW/SW systems for structural faults

    Efficient multi-level fault simulation of HW/SW systems for structural faults by Baranowski, Rafal, Di Carlo, Stefano, Hatami, Nadereh, Imhof, Michael E., Kochte, Michael A., Prinetto, Paolo, Wunderlich, Hans-Joachim, Zoellin, Christian G.

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  3. 3
    Test Strategies for Reliable Runtime Reconfigurable Architectures

    Test Strategies for Reliable Runtime Reconfigurable Architectures by Bauer, L., Braun, C., Imhof, M. E., Kochte, M. A., Schneider, E., Hongyan Zhang, Henkel, J., Wunderlich, Hans-Joachim

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  4. 4
    Structural Software-Based Self-Test of Network-on-Chip

    Structural Software-Based Self-Test of Network-on-Chip by Dalirsani, Atefe, Imhof, Michael E., Wunderlich, Hans-Joachim

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  5. 5
    Scan chain clustering for test power reduction

    Scan chain clustering for test power reduction by Elm, Melanie, Wunderlich, Hans-Joachim, Imhof, Michael E., Zoellin, Christian G., Leenstra, Jens, Maeding, Nicolas

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  6. 6
    Bit-Flipping Scan - A unified architecture for fault tolerance and offline test

    Bit-Flipping Scan - A unified architecture for fault tolerance and offline test by Imhof, Michael E., Wunderlich, Hans-Joachim

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  7. 7
    Scan test planning for power reduction

    Scan test planning for power reduction by Imhof, Michael E., Zoellin, Christian G., Wunderlich, Hans-Joachim, Maeding, Nicolas, Leenstra, Jens

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  8. 8
    Synthesis of workload monitors for on-line stress prediction

    Synthesis of workload monitors for on-line stress prediction by Baranowski, Rafal, Cook, Alejandro, Imhof, Michael E., Liu, Chang, Wunderlich, Hans-Joachim

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  9. 9
    On Covering Structural Defects in NoCs by Functional Tests

    On Covering Structural Defects in NoCs by Functional Tests by Dalirsani, Atefe, Hatami, Nadereh, Imhof, Michael E., Eggenberger, Marcus, Schley, Gert, Radetzki, Martin, Wunderlich, Hans-Joachim

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  10. 10
    Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures

    Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures by Hongyan Zhang, Bauer, Lars, Kochte, Michael A., Schneider, Eric, Braun, Claus, Imhof, Michael E., Wunderlich, Hans-Joachim, Henkel, Jorg

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  11. 11
    GUARD: GUAranteed reliability in dynamically reconfigurable systems

    GUARD: GUAranteed reliability in dynamically reconfigurable systems by Hongyan Zhang, Kochte, Michael A., Imhof, Michael E., Bauer, Lars, Wunderlich, H-J, Henkel, Jorg

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  12. 12
    P-PET: Partial pseudo-exhaustive test for high defect coverage

    P-PET: Partial pseudo-exhaustive test for high defect coverage by Mumtaz, A., Imhof, M. E., Wunderlich, H.

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  13. 13
    Embedded Test for Highly Accurate Defect Localization

    Embedded Test for Highly Accurate Defect Localization by Mumtaz, A., Imhof, M. E., Holst, S., Wunderlich, H-J

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  14. 14
    Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

    Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level by Kochte, M A, Zoellin, C G, Baranowski, R, Imhof, M E, Wunderlich, H, Hatami, N, Carlo, S D, Prinetto, P

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  15. 15
    System reliability evaluation using concurrent multi-level simulation of structural faults

    System reliability evaluation using concurrent multi-level simulation of structural faults by Kochte, M A, Zoellin, C G, Baranowski, R, Imhof, M E, Wunderlich, Hans-Joachim, Hatami, N, Di Carlo, S, Prinetto, P

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  16. 16
    Test exploration and validation using transaction level models

    Test exploration and validation using transaction level models by Kochte, M.A., Zoellin, C.G., Imhof, M.E., Khaligh, R.S., Radetzki, M., Wunderlich, H.-J., Di Carlo, S., Prinetto, P.

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  17. 17
    Soft error correction in embedded storage elements

    Soft error correction in embedded storage elements by Imhof, M. E., Wunderlich, Hans-Joachim

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  18. 18
    Variation-aware deterministic ATPG

    Variation-aware deterministic ATPG by Sauer, Matthias, Polian, Ilia, Imhof, Michael E., Mumtaz, Abdullah, Schneider, Eric, Czutro, Alexander, Wunderlich, Hans-Joachim, Becker, Bernd

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  19. 19
    OTERA: Online test strategies for reliable reconfigurable architectures - Invited paper for the AHS-2012 special session "Dependability by reconfigurable hardware"

    OTERA: Online test strategies for reliable reconfigurable architectures - Invited paper for the AHS-2012 special session "Dependability by reconfigurable hardware" by Bauer, L., Braun, C., Imhof, M. E., Kochte, M. A., Hongyan Zhang, Wunderlich, H-J, Henkel, J.

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  20. 20
    Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test

    Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test by Cook, Alejandro, Hellebrand, Sybille, Imhof, Michael E., Mumtaz, Abdullah, Wunderlich, Hans-Joachim

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