Search Results - Ingelsson, U.
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Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias
Conference Proceeding -
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Test scheduling for modular SOCs in an abort-on-fail environment
Conference Proceeding -
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Resistive Bridging Faults DFT with Adaptive Power Management Awareness
Conference Proceeding -
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Scheduling Tests for 3D Stacked Chips under Power Constraints
Conference Proceeding -
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Measurement point selection for in-operation wear-out monitoring
Conference Proceeding -
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