Search Results - Ingemarsson, P. Anders

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  1. 1
    Chemical modifications at Teflon interfaces induced by MeV ion beams

    Chemical modifications at Teflon interfaces induced by MeV ion beams by Ingemarsson, P. Anders, Keane, Michael P., Gelius, Ulrik

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  2. 2
    Recoil spectrometry : ion accelerator based elemental characterisation of surface layers

    Recoil spectrometry : ion accelerator based elemental characterisation of surface layers by WHITLOW, H. J, ANDERSSON, M, JOHNSTON, P. N, BUBB, I. F, WALKER, S. R, JOHANSON, E, HOGMARK, S, INGEMARSSON, P. A, HULT, M, PERSSON, L, MOHAMED EL BOUANANI, ÖSTLING, M, ZARING, C, LUNDBERG, N, COHEN, D. D, DYTLEWSKI, N

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  3. 3
    Radiation-induced interface phenomena: decoration of high-energy density ion tracks

    Radiation-induced interface phenomena: decoration of high-energy density ion tracks by INGEMARSSON, P. A, SUNDQVIST, B. U. R, NIEH, C. W, TOMBRELLO, T. A

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  4. 4
    A method for measuring light ion reaction cross-sections

    A method for measuring light ion reaction cross-sections by Carlson, R.F., Ingemarsson, A., Lantz, M., Arendse, G.J., Auce, A., Cox, A.J., Förtsch, S.V., Jacobs, N.M., Johansson, R., Nyberg, J., Peavy, J., Renberg, P.-U., Sundberg, O., Stander, J.A., Steyn, G.F., Tibell, G., Zorro, R.

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