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Optimization of Tests for Managing Silicon Defects in Data Centers
by
Lerner, David P.
,
Inkley, Benson
,
Sahasrabudhe, Shubhada H.
,
Hansen, Ethan
,
Munoz, Luis D. Rojas
,
de Ven, Arjan van
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Conference Proceedings
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Computer Science
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Computer Science, Hardware & Architecture
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Computer Science, Theory & Methods
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Data Centers
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Defects
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Engineering
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Engineering, Electrical & Electronic
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Optimization
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Reliability
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Science & Technology
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Screening
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Sde
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Silicon
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System Test
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Technology
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Ieee Electronic Library (Iel) Conference Proceedings
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