Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique–impedance spectroscopy analysis by Stakhira, Pavlo Y., Grygorchak, Ivan I., Cherpak, Vladyslav V., Ivastchyshyn, Fedir O., Volynyuk, Dmytro Y., Luka, Grzegorz, Godlewski, Marek, Guziewicz, Elzbieta, Pakhomov, Georgi L., Hotra, Zenon Y.

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