Search Results - Iwanishi, N.

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  1. 1
    Dual threshold delay model for nonlinear device characterization

    Dual threshold delay model for nonlinear device characterization by Tomita, Y., Iwanishi, N., Yamaguchi, R., Edamatsu, H.

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  2. 2
    Ratio based hot-carrier degradation modeling for aged timing simulation of millions of transistors digital circuits

    Ratio based hot-carrier degradation modeling for aged timing simulation of millions of transistors digital circuits by Yonezawa, H., Jingjun Fang, Kawakami, Y., Iwanishi, N., Lifeng Wu, Chen, A.I.-H., Koike, N., Ping Chen, Chune-Sin Yeh, Zhihong Liu

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  3. 3
    Gate-level aged timing simulation methodology for hot-carrier reliability assurance

    Gate-level aged timing simulation methodology for hot-carrier reliability assurance by Kawakami, Y., Jingkun Fang, Yonezawa, H., Iwanishi, N., Lifeng Wu, I-Hsien Chen, A., Koike, N., Ping Chen, Chune-Sin Yeh, Zhihong Liu

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  4. 4
    Brief Hourly Exercise during Night Work can Help Maintain Workers' Performance

    Brief Hourly Exercise during Night Work can Help Maintain Workers' Performance by SATO, Tomoaki, KUBO, Tomohide, EBARA, Takeshi, TAKEYAMA, Hidemaro, INOUE, Tatsuki, IWANISHI, Megumi, TACHI, Norihide, ITANI, Toru, KAMIJIMA, Michihiro

    Published in Industrial Health
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