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Effect of film composition and structure on the crystallization point of atomic layer deposited HfAlox using metal (diethylamino) precursors and ozone
by
KATAMREDDY, Rajesh
,
INMAN, Ronald
,
JURSICHA, Gregory
,
SOULET, Axel
,
TAKOUDIS, Christos
Published in
Acta materialia
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Acta Materialia
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Annealing
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Applied Sciences
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Cross-Disciplinary Physics: Materials Science; Rheology
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Crystallization
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Methods Of Deposition Of Films And Coatings; Film Growth And Epitaxy
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Multi-Layer Thin Films
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