Search Results - Jayez, David

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  1. 1
    Wafer backside cleaning for defect reduction and litho hot spots mitigation: DI: Defect inspection and reduction

    Wafer backside cleaning for defect reduction and litho hot spots mitigation: DI: Defect inspection and reduction by Balu, Elango, Tseng, Wei-Tsu, Jayez, David, Mody, Jay, Donegan, Keith

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    Metrology manufacturing control factors: A holistic approach for supporting 14nm and 7nm

    Metrology manufacturing control factors: A holistic approach for supporting 14nm and 7nm by Jayez, David, Vaid, Alok, Solecky, Eric, Lenahan, Michael, Dixit, Dhairya, Largo, Charles, Vakas, Georgios, Seipp, Steve

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    Manufacturing excellence using multi-platform ellipsometry thickness measurement fleet on advanced nodes

    Manufacturing excellence using multi-platform ellipsometry thickness measurement fleet on advanced nodes by Lenahan, Michael, Vaid, Alok, Mahendrakar, Sridhar, Seipp, Steven, Jayez, David, Yueh, Alice, Saxena, Shweta, Solecky, Eric, Gizzi, Samuel, Heller, Amir, Zhang, Tianhao, Song, Da, Yoon, Nam Hee, Camp, Janay, Venkataraman, Kartik

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