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A 4 Gb DDR SDRAM with gain-controlled pre-sensing and reference bitline calibration schemes in the twisted open bitline architecture
by
Hongil Yoon
,
Jae Yoon Sim
,
Hyun Suk Lee
,
Kyu Nam Lim
,
Jae Young Lee
,
Nam Jong Kim
,
Keum Yong Kim
,
Sang Man Byun
,
Won Suk Yang
,
Chang Hyun Choi
,
Hong Sik Jeong
,
Jel Hwan Yoo
,
Dong Il Seo
,
Kinam Kim
,
Byung Il Ryu
,
Chang Gyu Hwang
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Calibration
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Capacitance
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Circuit Noise
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Coupling Circuits
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Dram Chips
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Mos Devices
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Random Access Memory
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