Independent components analysis of single trial CNV data by Jervis, B.W, Britton, J.H

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Event-related potential correlates of implicit and explicit memory by Porter, N.R., Mayes, A.R., Jervis, B.W.

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Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study by Maiden, Y., Jervis, B.W., Fouillat, P., Lesage, S.

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Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons by Yu, S., Jervis, B.W., Eckersall, K.R., Bell, I.M.

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Application of artificial neural networks to CNV data to investigate schizophrenia by Jervis, B.W., Saatchi, M.R., Yu, S., Harrison, R.F., Lim, C.P., Oke, S.

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Fast training of multilayer perceptrons with a mixed norm algorithm by Abid, S., Fnaiech, F., Jervis, B.W., Cheriet, M.

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Fault diagnosis for a delta-sigma converter by a neural network by Jervis, B.W., Holding, J.M.

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Two Simple Methods For The Measurement Of The Dielectric Permittivity Of Low-Loss Microstrip Substrates by Pannell, R.M., Jervis, B.W.

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Extracting single trial event related potentials by Britton, J, Jervis, B.W, Grunewald, R.A

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Avalanche effects in bulk InP microwave diode oscillators by Jervis, B.W., Hobson, G.S.

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Contact conductivity notch effects in indium phosphide microwave oscillators by Jervis, B.W., Hobson, G.S.

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