Search Results - Johnson, A.W.S

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  1. 1
    Charge density analysis from complementary high energy synchrotron X-ray and electron diffraction data

    Charge density analysis from complementary high energy synchrotron X-ray and electron diffraction data by Streltsov, V.A, Nakashima, P.N.H, Johnson, A.W.S

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  2. 2
    Measuring the PSF from aperture images of arbitrary shape—an algorithm

    Measuring the PSF from aperture images of arbitrary shape—an algorithm by Nakashima, P.N.H., Johnson, A.W.S.

    Published in Ultramicroscopy
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  3. 3
    Transmission electron microscopy study of Y1−x□xCr2S4, x∼1/3 phase

    Transmission electron microscopy study of Y1−x□xCr2S4, x∼1/3 phase by Gómez-Herrero, A., Landa-Cánovas, A.R., Johnson, A.W.S., Otero-Dı́az, L.C.

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  4. 4
    Transmission electron microscopy study of Y 1− x□ xCr 2S 4, x∼1/3 phase

    Transmission electron microscopy study of Y 1− x□ xCr 2S 4, x∼1/3 phase by Gómez-Herrero, A., Landa-Cánovas, A.R., Johnson, A.W.S., Otero-Dı́az, L.C.

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  5. 5
    Effects of Debye-Waller factors and compositional uncertainties on the 200 structure factor refinement eta in-TiAl

    Effects of Debye-Waller factors and compositional uncertainties on the 200 structure factor refinement eta in-TiAl by Swaminathan, S., Jones, I.P., Maher, D.M., Johnson, A.W.S., Fraser, H.L.

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  6. 6
    Some notes on the selection of structural chirality by CBED

    Some notes on the selection of structural chirality by CBED by Johnson, A.W.S., Preston, A.R.

    Published in Ultramicroscopy
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  7. 7
    Investigation of mineralogical and synthetic Cu 2O by HREM and CBED

    Investigation of mineralogical and synthetic Cu 2O by HREM and CBED by Moss, B.K., Goodman, P., Johnson, A.W.S.

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  8. 8
    Investigation of mineralogical and synthetic Cu2O by HREM and CBED

    Investigation of mineralogical and synthetic Cu2O by HREM and CBED by MOSS, B. K, GOODMAN, P, JOHNSON, A. W. S

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  9. 9
    A simplified method of electron microscope voltage measurement

    A simplified method of electron microscope voltage measurement by Fitz Gerald, J.D., Johnson, A.W.S.

    Published in Ultramicroscopy
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  10. 10
    Techniques for convergent-beam electron diffraction

    Techniques for convergent-beam electron diffraction by Dowell, W.C.T., Goodman, P., Johnson, A.W.S., Williams, D.

    Published in Ultramicroscopy
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