Search Results - Jongsin Yun

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  1. 1
    Ion-Enrichment and Ion-Depletion Effect of Nanochannel Structures

    Ion-Enrichment and Ion-Depletion Effect of Nanochannel Structures by Pu, Qiaosheng, Yun, Jongsin, Temkin, Henryk, Liu, Shaorong

    Published in Nano letters
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  2. 2
    Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM

    Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM by Mamaghani, Sina Bakhtavari, Yun, Jongsin, Keim, Martin, Tahoori, Mehdi

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  3. 3
    Smart Hammering: A practical method of pinhole detection in MRAM memories

    Smart Hammering: A practical method of pinhole detection in MRAM memories by Mamaghani, Sina Bakhtavari, Munch, Christopher, Yun, Jongsin, Keim, Martin, Tahoori, Mehdi Baradaran

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  4. 4
    Thin-Film Thermal Conductivity Measurement Using Microelectrothermal Test Structures and Finite-Element-Model-Based Data Analysis

    Thin-Film Thermal Conductivity Measurement Using Microelectrothermal Test Structures and Finite-Element-Model-Based Data Analysis by Stojanovic, N., Jongsin Yun, Washington, E.B.K., Berg, J.M., Holtz, M.W., Temkin, H.

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  5. 5
    MBIST-based weak bit screening method for embedded MRAM

    MBIST-based weak bit screening method for embedded MRAM by Yun, Jongsin, Mamaghani, Sina Bakhtavari, Tahoori, Mehdi, Munch, Christopher, Keim, Martin

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  6. 6
    MBIST-based MRAM defect screening for safety-critical applications

    MBIST-based MRAM defect screening for safety-critical applications by Mamaghani, Sina Bakhtavari, Yun, Jongsin, Keim, Martin, Tahoori, Mehdi

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  7. 7
    MBIST-based Trim-Search Test Time Reduction for STT-MRAM

    MBIST-based Trim-Search Test Time Reduction for STT-MRAM by Munch, Christopher, Yun, Jongsin, Keim, Martin, Tahoori, Mehdi B.

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  8. 8
    Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies

    Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies by Lee, Jaehoon, Son, Hyeonuk, Kang, Seohyun, Kang, Dahyun, Han, Dongkwan, Yun, Jongsin, Pogiel, Artur, Racine, Etienne, Jurga, Krzysztof, Schramm, Lori, Keim, Martin

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  9. 9
    MBIST Supported Multi Step Trim for Reliable eMRAM Sensing

    MBIST Supported Multi Step Trim for Reliable eMRAM Sensing by Yun, Jongsin, Nadeau-Dostie, Benoit, Keim, Martin, Schramm, Lori, Dray, Cyrille, Boujamaa, Mehdi, Gelda, Khushal

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  10. 10
    MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM

    MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM by Munch, Christopher, Yun, Jongsin, Keim, Martin, Tahoori, Mehdi B.

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  11. 11
    MBIST Support for Reliable eMRAM Sensing

    MBIST Support for Reliable eMRAM Sensing by Yun, Jongsin, Nadeau-Dostie, Benoit, Keim, Martin, Dray, Cyrille, Boujamaa, Mehdi

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  12. 12
    Testing for FM-radio interference in motor vehicles

    Testing for FM-radio interference in motor vehicles by Trost, T.F., Ye Jin, Jongsin Yun, Qianlin Zhou

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